I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Subspace analysis based machine learning method for automat..:
Pandey, Dhruvam
;
Ramaiah, Jagadesh
;
Ajithaprasad, Sreeprasad
.
Optik. 270 (2022) - p. 170026 , 2022
Link:
https://doi.org/10.1016/j.ijleo.2022.170026
RT Journal T1
Subspace analysis based machine learning method for automated defect detection from fringe patterns
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.ijleo.2022.170026&Exemplar=1&LAN=DE A1 Pandey, Dhruvam A1 Ramaiah, Jagadesh A1 Ajithaprasad, Sreeprasad A1 Gannavarpu, Rajshekhar PB Elsevier BV YR 2022 SN 0030-4026 JF Optik VO 270 SP 170026 LK http://dx.doi.org/https://doi.org/10.1016/j.ijleo.2022.170026 DO https://doi.org/10.1016/j.ijleo.2022.170026 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)