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1 Ergebnisse
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Study on the ablation process and failure mechanism of the ..:
Tian, Yi
;
Zhu, Guixin
;
Miao, Qingqing
...
International Journal of Electrochemical Science. 19 (2024) 8 - p. 100662 , 2024
Link:
https://doi.org/10.1016/j.ijoes.2024.100662
RT Journal T1 <Title>Study on the ablation process and failure mechanism of the buffer layer in high-voltage XLPE cable</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.ijoes.2024.100662&Exemplar=1&LAN=DE A1 Tian, Yi A1 Zhu, Guixin A1 Miao, Qingqing A1 Huang, Jiasheng A1 Huang, Xinbo A1 Li, Shengtao A1 Li, Licheng PB Elsevier BV YR 2024 SN 1452-3981 JF International Journal of Electrochemical Science VO 19 IS 8 SP 100662 LK http://dx.doi.org/https://doi.org/10.1016/j.ijoes.2024.100662 DO https://doi.org/10.1016/j.ijoes.2024.100662 SF ELIB - SuUB Bremen
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