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Cracking mechanisms in lithiated silicon thin film electrod..:
Chew, Huck Beng
;
Hou, Binyue
;
Wang, Xueju
.
International Journal of Solids and Structures. 51 (2014) 23-24 - p. 4176-4187 , 2014
Link:
https://doi.org/10.1016/j.ijsolstr.2014.08.008
RT Journal T1 <Title>Cracking mechanisms in lithiated silicon thin film electrodes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.ijsolstr.2014.08.008&Exemplar=1&LAN=DE A1 Chew, Huck Beng A1 Hou, Binyue A1 Wang, Xueju A1 Xia, Shuman PB Elsevier BV YR 2014 SN 0020-7683 JF International Journal of Solids and Structures VO 51 IS 23-24 SP 4176 OP 4187 LK http://dx.doi.org/https://doi.org/10.1016/j.ijsolstr.2014.08.008 DO https://doi.org/10.1016/j.ijsolstr.2014.08.008 SF ELIB - SuUB Bremen
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