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On the defect detection limits of flash thermography in ref..:
Poelman, Gaétan
;
Hedayatrasa, Saeid
;
Van Paepegem, Wim
.
Infrared Physics & Technology. 138 (2024) - p. 105245 , 2024
Link:
https://doi.org/10.1016/j.infrared.2024.105245
RT Journal T1
On the defect detection limits of flash thermography in reflection mode: A comprehensive parametric 3D FE study
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.infrared.2024.105245&Exemplar=1&LAN=DE A1 Poelman, Gaétan A1 Hedayatrasa, Saeid A1 Van Paepegem, Wim A1 Kersemans, Mathias PB Elsevier BV YR 2024 SN 1350-4495 JF Infrared Physics & Technology VO 138 SP 105245 LK http://dx.doi.org/https://doi.org/10.1016/j.infrared.2024.105245 DO https://doi.org/10.1016/j.infrared.2024.105245 SF ELIB - SuUB Bremen
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