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Influence of the organic layer thickness in (Metal-Assisted..:
Wehbe, Nimer
;
Mouhib, Taoufiq
;
Prabhakaran, Aneesh
..
Journal of the American Society for Mass Spectrometry. 20 (2009) 12 - p. 2294-2303 , 2009
Link:
https://doi.org/10.1016/j.jasms.2009.08.022
RT Journal T1 <Title>Influence of the organic layer thickness in (Metal-Assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.jasms.2009.08.022&Exemplar=1&LAN=DE A1 Wehbe, Nimer A1 Mouhib, Taoufiq A1 Prabhakaran, Aneesh A1 Bertrand, Patrick A1 Delcorte, Arnaud PB American Chemical Society (ACS) YR 2009 SN 1044-0305 JF Journal of the American Society for Mass Spectrometry VO 20 IS 12 SP 2294 OP 2303 LK http://dx.doi.org/https://doi.org/10.1016/j.jasms.2009.08.022 DO https://doi.org/10.1016/j.jasms.2009.08.022 SF ELIB - SuUB Bremen
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