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1 Ergebnisse
1
Infrared measurement of Ge concentration in CZ–Si:
Jiang, Zhongwei
;
Zhang, Weilian
;
Niu, Xinhuan
.
Journal of Crystal Growth. 279 (2005) 1-2 - p. 65-69 , 2005
Link:
https://doi.org/10.1016/j.jcrysgro.2005.02.021
RT Journal T1
Infrared measurement of Ge concentration in CZ–Si
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.jcrysgro.2005.02.021&Exemplar=1&LAN=DE A1 Jiang, Zhongwei A1 Zhang, Weilian A1 Niu, Xinhuan A1 Yan, Liqin PB Elsevier BV YR 2005 SN 0022-0248 JF Journal of Crystal Growth VO 279 IS 1-2 SP 65 OP 69 LK http://dx.doi.org/https://doi.org/10.1016/j.jcrysgro.2005.02.021 DO https://doi.org/10.1016/j.jcrysgro.2005.02.021 SF ELIB - SuUB Bremen
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