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1 Ergebnisse
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Dual beam-shear differential interference microscopy for fu..:
Zeng, Zhuohui
;
Chiu, Hoi-Chun
;
Zhao, Luwei
...
Journal of the Mechanics and Physics of Solids. 145 (2020) - p. 104162 , 2020
Link:
https://doi.org/10.1016/j.jmps.2020.104162
RT Journal T1
Dual beam-shear differential interference microscopy for full-field surface deformation gradient characterization
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.jmps.2020.104162&Exemplar=1&LAN=DE A1 Zeng, Zhuohui A1 Chiu, Hoi-Chun A1 Zhao, Luwei A1 Zhao, Teng A1 Zhang, Chenbo A1 Karami, Mostafa A1 Yu, Hongyu A1 Du, Shengwang A1 Chen, Xian PB Elsevier BV YR 2020 SN 0022-5096 JF Journal of the Mechanics and Physics of Solids VO 145 SP 104162 LK http://dx.doi.org/https://doi.org/10.1016/j.jmps.2020.104162 DO https://doi.org/10.1016/j.jmps.2020.104162 SF ELIB - SuUB Bremen
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