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1 Ergebnisse
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Mechanical characterization of thin films via constant stra..:
Kim, Hojang
;
Choi, Jae-Hoon
;
Park, Yuhyun
..
Journal of the Mechanics and Physics of Solids. 173 (2023) - p. 105209 , 2023
Link:
https://doi.org/10.1016/j.jmps.2023.105209
RT Journal T1 <Title>Mechanical characterization of thin films via constant strain rate membrane deflection experiments</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.jmps.2023.105209&Exemplar=1&LAN=DE A1 Kim, Hojang A1 Choi, Jae-Hoon A1 Park, Yuhyun A1 Choi, Sunkun A1 Sim, Gi-Dong PB Elsevier BV YR 2023 SN 0022-5096 JF Journal of the Mechanics and Physics of Solids VO 173 SP 105209 LK http://dx.doi.org/https://doi.org/10.1016/j.jmps.2023.105209 DO https://doi.org/10.1016/j.jmps.2023.105209 SF ELIB - SuUB Bremen
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