I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Toughness behavior and deformation mechanisms in FCC-based ..:
Jo, Yong Hee
;
Choi, Yeon Taek
;
Kim, Dong Geun
..
Journal of Materials Research and Technology. 30 (2024) - p. 1758-1767 , 2024
Link:
https://doi.org/10.1016/j.jmrt.2024.03.211
RT Journal T1
Toughness behavior and deformation mechanisms in FCC-based Fe45Co30Cr10V10Ni5-xMnx high-entropy alloys: Insights from instrumented Charpy impact tests
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.jmrt.2024.03.211&Exemplar=1&LAN=DE A1 Jo, Yong Hee A1 Choi, Yeon Taek A1 Kim, Dong Geun A1 Han, Jeongho A1 Lee, Sukjin PB Elsevier BV YR 2024 SN 2238-7854 JF Journal of Materials Research and Technology VO 30 SP 1758 OP 1767 LK http://dx.doi.org/https://doi.org/10.1016/j.jmrt.2024.03.211 DO https://doi.org/10.1016/j.jmrt.2024.03.211 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)