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The quantitative 6H-SiC crystal damage depth profiling:
Gloginjić, M.
;
Erich, M.
;
Kokkoris, M.
...
Journal of Nuclear Materials. 555 (2021) - p. 153143 , 2021
Link:
https://doi.org/10.1016/j.jnucmat.2021.153143
RT Journal T1
The quantitative 6H-SiC crystal damage depth profiling
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.jnucmat.2021.153143&Exemplar=1&LAN=DE A1 Gloginjić, M. A1 Erich, M. A1 Kokkoris, M. A1 Liarokapis, E. A1 Fazinić, S. A1 Karlušić, M. A1 Tomić Luketić, K. A1 Petrović, S. PB Elsevier BV YR 2021 SN 0022-3115 JF Journal of Nuclear Materials VO 555 SP 153143 LK http://dx.doi.org/https://doi.org/10.1016/j.jnucmat.2021.153143 DO https://doi.org/10.1016/j.jnucmat.2021.153143 SF ELIB - SuUB Bremen
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