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The symbolic defect of an ideal:
Galetto, Federico
;
Geramita, Anthony V.
;
Shin, Yong-Su
.
Journal of Pure and Applied Algebra. 223 (2019) 6 - p. 2709-2731 , 2019
Link:
https://doi.org/10.1016/j.jpaa.2018.11.019
RT Journal T1 <Title>The symbolic defect of an ideal</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.jpaa.2018.11.019&Exemplar=1&LAN=DE A1 Galetto, Federico A1 Geramita, Anthony V. A1 Shin, Yong-Su A1 Van Tuyl, Adam PB Elsevier BV YR 2019 SN 0022-4049 JF Journal of Pure and Applied Algebra VO 223 IS 6 SP 2709 OP 2731 LK http://dx.doi.org/https://doi.org/10.1016/j.jpaa.2018.11.019 DO https://doi.org/10.1016/j.jpaa.2018.11.019 SF ELIB - SuUB Bremen
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