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1 Ergebnisse
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New insights into CoFe/n-Si interfacial structure as probed..:
Kumar, Arvind
;
Shripathi, T.
;
Srivastava, P.C.
Journal of Science: Advanced Materials and Devices. 1 (2016) 3 - p. 290-294 , 2016
Link:
https://doi.org/10.1016/j.jsamd.2016.07.008
RT Journal T1 <Title>New insights into CoFe/n-Si interfacial structure as probed by X-ray photoelectron spectroscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.jsamd.2016.07.008&Exemplar=1&LAN=DE A1 Kumar, Arvind A1 Shripathi, T. A1 Srivastava, P.C. PB Elsevier BV YR 2016 SN 2468-2179 JF Journal of Science: Advanced Materials and Devices VO 1 IS 3 SP 290 OP 294 LK http://dx.doi.org/https://doi.org/10.1016/j.jsamd.2016.07.008 DO https://doi.org/10.1016/j.jsamd.2016.07.008 SF ELIB - SuUB Bremen
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