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Investigation of p-type nanocrystalline silicon oxide thin ..:
Kim, Sangho
;
Iftiquar, S.M.
;
Shin, Chonghoon
..
Materials Chemistry and Physics. 229 (2019) - p. 392-401 , 2019
Link:
https://doi.org/10.1016/j.matchemphys.2019.03.029
RT Journal T1
Investigation of p-type nanocrystalline silicon oxide thin film prepared at various growth temperatures
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.matchemphys.2019.03.029&Exemplar=1&LAN=DE A1 Kim, Sangho A1 Iftiquar, S.M. A1 Shin, Chonghoon A1 Park, Jinjoo A1 Yi, Junsin PB Elsevier BV YR 2019 SN 0254-0584 JF Materials Chemistry and Physics VO 229 SP 392 OP 401 LK http://dx.doi.org/https://doi.org/10.1016/j.matchemphys.2019.03.029 DO https://doi.org/10.1016/j.matchemphys.2019.03.029 SF ELIB - SuUB Bremen
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