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1 Ergebnisse
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Atomic force microscopy (AFM) and 3D confocal microscopy as..:
Oyarzún, Diego P.
;
Linarez Pérez, Omar E.
;
López Teijelo, Manuel
...
Materials Letters. 165 (2016) - p. 67-70 , 2016
Link:
https://doi.org/10.1016/j.matlet.2015.11.087
RT Journal T1
Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO 2 nanoporous layers
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.matlet.2015.11.087&Exemplar=1&LAN=DE A1 Oyarzún, Diego P. A1 Linarez Pérez, Omar E. A1 López Teijelo, Manuel A1 Zúñiga, César A1 Jeraldo, Eduardo A1 Geraldo, Daniela A. A1 Arratia-Perez, Ramiro PB Elsevier BV YR 2016 SN 0167-577X JF Materials Letters VO 165 SP 67 OP 70 LK http://dx.doi.org/https://doi.org/10.1016/j.matlet.2015.11.087 DO https://doi.org/10.1016/j.matlet.2015.11.087 SF ELIB - SuUB Bremen
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