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1 Ergebnisse
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Nanopositioning X–Y stage with an embedded Six-DOF error co..:
He, Ya-Xiong
;
Lin, Rong-Wei
;
Li, Rui-Jun
...
Measurement. 227 (2024) - p. 114218 , 2024
Link:
https://doi.org/10.1016/j.measurement.2024.114218
RT Journal T1
Nanopositioning X–Y stage with an embedded Six-DOF error compensation system based on Abbe and Bryan principles
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.measurement.2024.114218&Exemplar=1&LAN=DE A1 He, Ya-Xiong A1 Lin, Rong-Wei A1 Li, Rui-Jun A1 Li, Jie A1 Cheng, Zhen-Ying A1 Pan, Qiao-Sheng A1 Huang, Qiang-Xian A1 Fan, Kuang-Chao PB Elsevier BV YR 2024 SN 0263-2241 JF Measurement VO 227 SP 114218 LK http://dx.doi.org/https://doi.org/10.1016/j.measurement.2024.114218 DO https://doi.org/10.1016/j.measurement.2024.114218 SF ELIB - SuUB Bremen
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