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1 Ergebnisse
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Stochastic degradation modeling and remaining useful lifeti..:
Zezhou, WANG
;
Jian, Hou
;
Jiantai, Zhu
..
Measurement. 234 (2024) - p. 114803 , 2024
Link:
https://doi.org/10.1016/j.measurement.2024.114803
RT Journal T1
Stochastic degradation modeling and remaining useful lifetime prediction based on long short-term memory network
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.measurement.2024.114803&Exemplar=1&LAN=DE A1 Zezhou, WANG A1 Jian, Hou A1 Jiantai, Zhu A1 Liyuan, Wang A1 Zhongyi, Cai PB Elsevier BV YR 2024 SN 0263-2241 JF Measurement VO 234 SP 114803 LK http://dx.doi.org/https://doi.org/10.1016/j.measurement.2024.114803 DO https://doi.org/10.1016/j.measurement.2024.114803 SF ELIB - SuUB Bremen
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