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1 Ergebnisse
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AI-enhanced time–frequency domain reflectometry for robust ..:
Park, Hwa-Pyeong
;
Kwon, Gu-Young
;
Lee, Chun-Kwon
.
Measurement. 238 (2024) - p. 115188 , 2024
Link:
https://doi.org/10.1016/j.measurement.2024.115188
RT Journal T1
AI-enhanced time–frequency domain reflectometry for robust series arc fault detection in DC grids
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.measurement.2024.115188&Exemplar=1&LAN=DE A1 Park, Hwa-Pyeong A1 Kwon, Gu-Young A1 Lee, Chun-Kwon A1 Chang, Seung Jin PB Elsevier BV YR 2024 SN 0263-2241 JF Measurement VO 238 SP 115188 LK http://dx.doi.org/https://doi.org/10.1016/j.measurement.2024.115188 DO https://doi.org/10.1016/j.measurement.2024.115188 SF ELIB - SuUB Bremen
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