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Infrared spectroscopy and X-ray diffraction studies on the ..:
Tsoutsou, D.
;
Scarel, G.
;
Debernardi, A.
...
Microelectronic Engineering. 85 (2008) 12 - p. 2411-2413 , 2008
Link:
https://doi.org/10.1016/j.mee.2008.09.033
RT Journal T1
Infrared spectroscopy and X-ray diffraction studies on the crystallographic evolution of La2O3 films upon annealing
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mee.2008.09.033&Exemplar=1&LAN=DE A1 Tsoutsou, D. A1 Scarel, G. A1 Debernardi, A. A1 Capelli, S.C. A1 Volkos, S.N. A1 Lamagna, L. A1 Schamm, S. A1 Coulon, P.E. A1 Fanciulli, M. PB Elsevier BV YR 2008 SN 0167-9317 JF Microelectronic Engineering VO 85 IS 12 SP 2411 OP 2413 LK http://dx.doi.org/https://doi.org/10.1016/j.mee.2008.09.033 DO https://doi.org/10.1016/j.mee.2008.09.033 SF ELIB - SuUB Bremen
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