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1 Ergebnisse
1
Detection of traps induced and activated by high field stre..:
Abboud, N.
;
Cuminal, Y.
;
Foucaran, A.
.
Microelectronic Engineering. 88 (2011) 11 - p. 3333-3337 , 2011
Link:
https://doi.org/10.1016/j.mee.2011.08.008
RT Journal T1
Detection of traps induced and activated by high field stress in an N-channel VDMOSFET transistor using current deep level transient spectroscopy (CDLTS)
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mee.2011.08.008&Exemplar=1&LAN=DE A1 Abboud, N. A1 Cuminal, Y. A1 Foucaran, A. A1 Salame, C. PB Elsevier BV YR 2011 SN 0167-9317 JF Microelectronic Engineering VO 88 IS 11 SP 3333 OP 3337 LK http://dx.doi.org/https://doi.org/10.1016/j.mee.2011.08.008 DO https://doi.org/10.1016/j.mee.2011.08.008 SF ELIB - SuUB Bremen
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