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Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in ..:
Navarro, Etienne
;
Cornelius, Thomas W.
;
Proudhon, Henry
...
Microelectronic Engineering. 276 (2023) - p. 111999 , 2023
Link:
https://doi.org/10.1016/j.mee.2023.111999
RT Journal T1
Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mee.2023.111999&Exemplar=1&LAN=DE A1 Navarro, Etienne A1 Cornelius, Thomas W. A1 Proudhon, Henry A1 Sahay, Rahul A1 Radchenko, Ihor A1 Escoubas, Stéphanie A1 Lee, Pooi See A1 Raghavan, Nagarajan A1 Budiman, Arief S. A1 Thomas, Olivier PB Elsevier BV YR 2023 SN 0167-9317 JF Microelectronic Engineering VO 276 SP 111999 LK http://dx.doi.org/https://doi.org/10.1016/j.mee.2023.111999 DO https://doi.org/10.1016/j.mee.2023.111999 SF ELIB - SuUB Bremen
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