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1 Ergebnisse
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Electrical modeling of tapered TSV including MOS-Field effe..:
Nabil, Amira
;
Bernardo, Jose A.
;
Ma, Yue
...
Microelectronics Journal. 100 (2020) - p. 104797 , 2020
Link:
https://doi.org/10.1016/j.mejo.2020.104797
RT Journal T1
Electrical modeling of tapered TSV including MOS-Field effect and substrate parasitics: Analysis and application
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mejo.2020.104797&Exemplar=1&LAN=DE A1 Nabil, Amira A1 Bernardo, Jose A. A1 Ma, Yue A1 Abouelatta, Mohamed A1 Shaker, Ahmed A1 Bouchet, Latifa Fakri A1 Ragai, Hani A1 Gontrand, Christian PB Elsevier BV YR 2020 SN 0026-2692 JF Microelectronics Journal VO 100 SP 104797 LK http://dx.doi.org/https://doi.org/10.1016/j.mejo.2020.104797 DO https://doi.org/10.1016/j.mejo.2020.104797 SF ELIB - SuUB Bremen
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