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1 Ergebnisse
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A digital calibration technique for N-channel time-interlea..:
Zhang, Yuhao
;
Han, Chenxi
;
Liu, Shubin
Microelectronics Journal. 133 (2023) - p. 105701 , 2023
Link:
https://doi.org/10.1016/j.mejo.2023.105701
RT Journal T1
A digital calibration technique for N-channel time-interleaved ADC based on simulated annealing algorithm
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mejo.2023.105701&Exemplar=1&LAN=DE A1 Zhang, Yuhao A1 Han, Chenxi A1 Liu, Shubin PB Elsevier BV YR 2023 SN 0026-2692 JF Microelectronics Journal VO 133 SP 105701 LK http://dx.doi.org/https://doi.org/10.1016/j.mejo.2023.105701 DO https://doi.org/10.1016/j.mejo.2023.105701 SF ELIB - SuUB Bremen
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