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An analytical subthreshold I–V model of SiC MOSFETs:
Li, Yi
;
Zhou, Tao
;
Jiang, Geng
...
Microelectronics Journal. 146 (2024) - p. 106138 , 2024
Link:
https://doi.org/10.1016/j.mejo.2024.106138
RT Journal T1
An analytical subthreshold I–V model of SiC MOSFETs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mejo.2024.106138&Exemplar=1&LAN=DE A1 Li, Yi A1 Zhou, Tao A1 Jiang, Geng A1 Deng, Liangbin A1 Guo, Zixuan A1 Sun, Qiaoling A1 Yin, Bangyong A1 Yang, Yuqiu A1 Wu, Junyao A1 Cai, Huan A1 Wang, Jun A1 Yin, Jungang A1 Liu, Qin A1 Deng, Linfeng PB Elsevier BV YR 2024 SN 0026-2692 JF Microelectronics Journal VO 146 SP 106138 LK http://dx.doi.org/https://doi.org/10.1016/j.mejo.2024.106138 DO https://doi.org/10.1016/j.mejo.2024.106138 SF ELIB - SuUB Bremen
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