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1 Ergebnisse
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Advanced fabrication process for combined atomic force-scan..:
Eifert, Alexander
;
Mizaikoff, Boris
;
Kranz, Christine
Micron. 68 (2015) - p. 27-35 , 2015
Link:
https://doi.org/10.1016/j.micron.2014.08.008
RT Journal T1
Advanced fabrication process for combined atomic force-scanning electrochemical microscopy (AFM-SECM) probes
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.micron.2014.08.008&Exemplar=1&LAN=DE A1 Eifert, Alexander A1 Mizaikoff, Boris A1 Kranz, Christine PB Elsevier BV YR 2015 SN 0968-4328 JF Micron VO 68 SP 27 OP 35 LK http://dx.doi.org/https://doi.org/10.1016/j.micron.2014.08.008 DO https://doi.org/10.1016/j.micron.2014.08.008 SF ELIB - SuUB Bremen
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