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1 Ergebnisse
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Design automation to suppress cable discharge event (CDE) i..:
Brennan, Ciaran J.
;
Chatty, Kiran
;
Sloan, Jeff
...
Microelectronics Reliability. 47 (2007) 7 - p. 1069-1073 , 2007
Link:
https://doi.org/10.1016/j.microrel.2006.11.008
RT Journal T1
Design automation to suppress cable discharge event (CDE) induced latchup in 90nm CMOS ASICs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2006.11.008&Exemplar=1&LAN=DE A1 Brennan, Ciaran J. A1 Chatty, Kiran A1 Sloan, Jeff A1 Dunn, Paul A1 Muhammad, Mujahid A1 Gauthier, Robert PB Elsevier BV YR 2007 SN 0026-2714 JF Microelectronics Reliability VO 47 IS 7 SP 1069 OP 1073 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2006.11.008 DO https://doi.org/10.1016/j.microrel.2006.11.008 SF ELIB - SuUB Bremen
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