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1 Ergebnisse
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Underfill selection methodology for fine pitch Cu/low-k FCB..:
Ong, Xuefen
;
Ho, Soon Wee
;
Ong, Yue Ying
...
Microelectronics Reliability. 49 (2009) 2 - p. 150-162 , 2009
Link:
https://doi.org/10.1016/j.microrel.2008.11.015
RT Journal T1
Underfill selection methodology for fine pitch Cu/low-k FCBGA packages
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2008.11.015&Exemplar=1&LAN=DE A1 Ong, Xuefen A1 Ho, Soon Wee A1 Ong, Yue Ying A1 Wai, Leong Ching A1 Vaidyanathan, Kripesh A1 Lim, Yeow Kheng A1 Yeo, David A1 Chan, Kai Chong A1 Tan, Juan Boon A1 Sohn, Dong Kyun A1 Hsia, Liang Choo A1 Chen, Zhong PB Elsevier BV YR 2009 SN 0026-2714 JF Microelectronics Reliability VO 49 IS 2 SP 150 OP 162 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2008.11.015 DO https://doi.org/10.1016/j.microrel.2008.11.015 SF ELIB - SuUB Bremen
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