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1 Ergebnisse
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Power grid redundant path contribution in system on chip (S..:
Ouattara, Boukary
;
Doyen, Lise
;
Ney, David
..
Microelectronics Reliability. 54 (2014) 9-10 - p. 1702-1706 , 2014
Link:
https://doi.org/10.1016/j.microrel.2014.07.016
RT Journal T1
Power grid redundant path contribution in system on chip (SoC) robustness against electromigration
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2014.07.016&Exemplar=1&LAN=DE A1 Ouattara, Boukary A1 Doyen, Lise A1 Ney, David A1 Mehrez, Habib A1 Bazargan-sabet, Pirouz PB Elsevier BV YR 2014 SN 0026-2714 JF Microelectronics Reliability VO 54 IS 9-10 SP 1702 OP 1706 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2014.07.016 DO https://doi.org/10.1016/j.microrel.2014.07.016 SF ELIB - SuUB Bremen
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