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1 Ergebnisse
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Correctable and uncorrectable errors using large scale DRAM..:
Baeg, Sanghyeon
;
Qasim, Mirza
;
Kwon, Junhyeong
...
Microelectronics Reliability. 99 (2019) - p. 104-112 , 2019
Link:
https://doi.org/10.1016/j.microrel.2019.05.008
RT Journal T1
Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2019.05.008&Exemplar=1&LAN=DE A1 Baeg, Sanghyeon A1 Qasim, Mirza A1 Kwon, Junhyeong A1 Li, Tan A1 Gupta, Nilay A1 Wen, Shi-Jie A1 Kolli, Satyadev PB Elsevier BV YR 2019 SN 0026-2714 JF Microelectronics Reliability VO 99 SP 104 OP 112 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2019.05.008 DO https://doi.org/10.1016/j.microrel.2019.05.008 SF ELIB - SuUB Bremen
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