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1 Ergebnisse
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Analysis of degradation in 25-year-old field-aged crystalli..:
Oh, Wonwook
;
Bae, Soohyun
;
Kim, Seongtak
...
Microelectronics Reliability. 100-101 (2019) - p. 113392 , 2019
Link:
https://doi.org/10.1016/j.microrel.2019.06.084
RT Journal T1
Analysis of degradation in 25-year-old field-aged crystalline silicon solar cells
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2019.06.084&Exemplar=1&LAN=DE A1 Oh, Wonwook A1 Bae, Soohyun A1 Kim, Seongtak A1 Park, Nochang A1 Chan, Sung-Il A1 Choi, Hoonjoo A1 Hwang, Heon A1 Kim, Donghwan PB Elsevier BV YR 2019 SN 0026-2714 JF Microelectronics Reliability VO 100-101 SP 113392 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2019.06.084 DO https://doi.org/10.1016/j.microrel.2019.06.084 SF ELIB - SuUB Bremen
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