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1 Ergebnisse
1
CSTBT™ technology for high voltage applications with high d..:
Nakamura, Katsumi
;
Chen, Ze
;
Nishizawa, Shin-ichi
.
Microelectronics Reliability. 110 (2020) - p. 113635 , 2020
Link:
https://doi.org/10.1016/j.microrel.2020.113635
RT Journal T1
CSTBT™ technology for high voltage applications with high dynamic robustness and low overall loss
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2020.113635&Exemplar=1&LAN=DE A1 Nakamura, Katsumi A1 Chen, Ze A1 Nishizawa, Shin-ichi A1 Furukawa, Akihiko PB Elsevier BV YR 2020 SN 0026-2714 JF Microelectronics Reliability VO 110 SP 113635 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2020.113635 DO https://doi.org/10.1016/j.microrel.2020.113635 SF ELIB - SuUB Bremen
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