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A novel on-wafer approach to test the stability of GaN-base..:
Modolo, Nicola
;
Meneghini, Matteo
;
Barbato, Alessandro
...
Microelectronics Reliability. 114 (2020) - p. 113830 , 2020
Link:
https://doi.org/10.1016/j.microrel.2020.113830
RT Journal T1
A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effects
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2020.113830&Exemplar=1&LAN=DE A1 Modolo, Nicola A1 Meneghini, Matteo A1 Barbato, Alessandro A1 Nardo, Arianna A1 De Santi, Carlo A1 Meneghesso, Gaudenzio A1 Zanoni, Enrico A1 Sicre, Sebastien A1 Prechtl, Gerhard A1 Curatola, Gilberto PB Elsevier BV YR 2020 SN 0026-2714 JF Microelectronics Reliability VO 114 SP 113830 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2020.113830 DO https://doi.org/10.1016/j.microrel.2020.113830 SF ELIB - SuUB Bremen
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