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1 Ergebnisse
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Degradation modeling with spatial mapping method in low tem..:
Kim, Kihwan
;
Song, Minjoon
;
Kim, Soonkon
...
Microelectronics Reliability. 116 (2021) - p. 114012 , 2021
Link:
https://doi.org/10.1016/j.microrel.2020.114012
RT Journal T1
Degradation modeling with spatial mapping method in low temperature poly silicon thin film transistor aged off-state bias
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2020.114012&Exemplar=1&LAN=DE A1 Kim, Kihwan A1 Song, Minjoon A1 Kim, Soonkon A1 Kim, Hyojung A1 Jeon, Sangho A1 Cho, Youngmi A1 Kim, Yongjo A1 Choi, Byoungdeog PB Elsevier BV YR 2021 SN 0026-2714 JF Microelectronics Reliability VO 116 SP 114012 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2020.114012 DO https://doi.org/10.1016/j.microrel.2020.114012 SF ELIB - SuUB Bremen
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