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1 Ergebnisse
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Vertical GaN devices: Process and reliability:
You, Shuzhen
;
Geens, Karen
;
Borga, Matteo
...
Microelectronics Reliability. 126 (2021) - p. 114218 , 2021
Link:
https://doi.org/10.1016/j.microrel.2021.114218
RT Journal T1
Vertical GaN devices: Process and reliability
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2021.114218&Exemplar=1&LAN=DE A1 You, Shuzhen A1 Geens, Karen A1 Borga, Matteo A1 Liang, Hu A1 Hahn, Herwig A1 Fahle, Dirk A1 Heuken, Michael A1 Mukherjee, Kalparupa A1 De Santi, Carlo A1 Meneghini, Matteo A1 Zanoni, Enrico A1 Berg, Martin A1 Ramvall, Peter A1 Kumar, Ashutosh A1 Björk, Mikael T. A1 Ohlsson, B. Jonas A1 Decoutere, Stefaan PB Elsevier BV YR 2021 SN 0026-2714 JF Microelectronics Reliability VO 126 SP 114218 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2021.114218 DO https://doi.org/10.1016/j.microrel.2021.114218 SF ELIB - SuUB Bremen
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