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1 Ergebnisse
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Failure case studies of fast ionization dynistors:
Huang, Xinyuan
;
Liang, Lin
;
Wang, Ganping
.
Microelectronics Reliability. 126 (2021) - p. 114257 , 2021
Link:
https://doi.org/10.1016/j.microrel.2021.114257
RT Journal T1
Failure case studies of fast ionization dynistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2021.114257&Exemplar=1&LAN=DE A1 Huang, Xinyuan A1 Liang, Lin A1 Wang, Ganping A1 Qing, Zhengheng PB Elsevier BV YR 2021 SN 0026-2714 JF Microelectronics Reliability VO 126 SP 114257 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2021.114257 DO https://doi.org/10.1016/j.microrel.2021.114257 SF ELIB - SuUB Bremen
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