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1 Ergebnisse
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Failure analysis on capacitor failures using simple circuit..:
Ting, Siong Luong
;
Tan, Pik Kee
;
Thoungh, Hnin Hnin Win
...
Microelectronics Reliability. 135 (2022) - p. 114566 , 2022
Link:
https://doi.org/10.1016/j.microrel.2022.114566
RT Journal T1
Failure analysis on capacitor failures using simple circuit edit passive voltage contrast method
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2022.114566&Exemplar=1&LAN=DE A1 Ting, Siong Luong A1 Tan, Pik Kee A1 Thoungh, Hnin Hnin Win A1 Menon, Krishnanunni A1 Xu, Naiyun A1 Pan, Yanlin A1 Chen, Changqing PB Elsevier BV YR 2022 SN 0026-2714 JF Microelectronics Reliability VO 135 SP 114566 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2022.114566 DO https://doi.org/10.1016/j.microrel.2022.114566 SF ELIB - SuUB Bremen
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