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1 Ergebnisse
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Using checksum to improve the reliability of embedded convo..:
Liu, Zhi
;
Deng, Zhen
;
Yang, Xinni
Microelectronics Reliability. 136 (2022) - p. 114666 , 2022
Link:
https://doi.org/10.1016/j.microrel.2022.114666
RT Journal T1
Using checksum to improve the reliability of embedded convolutional neural networks
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2022.114666&Exemplar=1&LAN=DE A1 Liu, Zhi A1 Deng, Zhen A1 Yang, Xinni PB Elsevier BV YR 2022 SN 0026-2714 JF Microelectronics Reliability VO 136 SP 114666 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2022.114666 DO https://doi.org/10.1016/j.microrel.2022.114666 SF ELIB - SuUB Bremen
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