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Modeling the electrical characteristic of InGaN/GaN blue-vi..:
Roccato, Nicola
;
Piva, Francesco
;
De Santi, Carlo
...
Microelectronics Reliability. 138 (2022) - p. 114724 , 2022
Link:
https://doi.org/10.1016/j.microrel.2022.114724
RT Journal T1
Modeling the electrical characteristic of InGaN/GaN blue-violet LED structure under electrical stress
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2022.114724&Exemplar=1&LAN=DE A1 Roccato, Nicola A1 Piva, Francesco A1 De Santi, Carlo A1 Buffolo, Matteo A1 Haller, Camille A1 Carlin, Jean-François A1 Grandjean, Nicolas A1 Vallone, Marco A1 Tibaldi, Alberto A1 Bertazzi, Francesco A1 Goano, Michele A1 Verzellesi, Giovanni A1 Meneghesso, Gaudenzio A1 Zanoni, Enrico A1 Meneghini, Matteo PB Elsevier BV YR 2022 SN 0026-2714 JF Microelectronics Reliability VO 138 SP 114724 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2022.114724 DO https://doi.org/10.1016/j.microrel.2022.114724 SF ELIB - SuUB Bremen
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