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1 Ergebnisse
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Ab initio investigations in amorphous silicon dioxide: Prop..:
Wilhelmer, Christoph
;
Waldhoer, Dominic
;
Jech, Markus
...
Microelectronics Reliability. 139 (2022) - p. 114801 , 2022
Link:
https://doi.org/10.1016/j.microrel.2022.114801
RT Journal T1
Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole capture
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2022.114801&Exemplar=1&LAN=DE A1 Wilhelmer, Christoph A1 Waldhoer, Dominic A1 Jech, Markus A1 El-Sayed, Al-Moatasem Bellah A1 Cvitkovich, Lukas A1 Waltl, Michael A1 Grasser, Tibor PB Elsevier BV YR 2022 SN 0026-2714 JF Microelectronics Reliability VO 139 SP 114801 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2022.114801 DO https://doi.org/10.1016/j.microrel.2022.114801 SF ELIB - SuUB Bremen
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