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Microelectronics Reliability: Publisher's note:
Li, Jimeng
Microelectronics Reliability. 143 (2023) - p. 114902 , 2023
Link:
https://doi.org/10.1016/j.microrel.2023.114902
RT Journal T1 <Title>Microelectronics Reliability: Publisher's note</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2023.114902&Exemplar=1&LAN=DE A1 Li, Jimeng PB Elsevier BV YR 2023 SN 0026-2714 JF Microelectronics Reliability VO 143 SP 114902 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2023.114902 DO https://doi.org/10.1016/j.microrel.2023.114902 SF ELIB - SuUB Bremen
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