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1 Ergebnisse
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Physics of failure based lifetime modelling for sintered si..:
Heilmann, Jens
;
Wunderle, Bernhard
;
Zschenderlein, Uwe
..
Microelectronics Reliability. 145 (2023) - p. 114973 , 2023
Link:
https://doi.org/10.1016/j.microrel.2023.114973
RT Journal T1
Physics of failure based lifetime modelling for sintered silver die attach in power electronics: Accelerated stress testing by isothermal bending and thermal shock in comparison
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2023.114973&Exemplar=1&LAN=DE A1 Heilmann, Jens A1 Wunderle, Bernhard A1 Zschenderlein, Uwe A1 Wille, Catharina A1 Pressel, Klaus PB Elsevier BV YR 2023 SN 0026-2714 JF Microelectronics Reliability VO 145 SP 114973 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2023.114973 DO https://doi.org/10.1016/j.microrel.2023.114973 SF ELIB - SuUB Bremen
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