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Physical insights into the reliability of sunken source con..:
Chanchal
;
Malik, Amit
;
Sehra, Khushwant
...
Microelectronics Reliability. 148 (2023) - p. 115170 , 2023
Link:
https://doi.org/10.1016/j.microrel.2023.115170
RT Journal T1
Physical insights into the reliability of sunken source connected field plate GaN HEMTs for mm-wave applications
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2023.115170&Exemplar=1&LAN=DE A1 Chanchal A1 Malik, Amit A1 Sehra, Khushwant A1 Laishram, Robert A1 Nair, Renju M. A1 Mishra, Meena A1 Rawal, Dipendra Singh A1 Saxena, Manoj PB Elsevier BV YR 2023 SN 0026-2714 JF Microelectronics Reliability VO 148 SP 115170 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2023.115170 DO https://doi.org/10.1016/j.microrel.2023.115170 SF ELIB - SuUB Bremen
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