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Exploring the impact of shrinking feature sizes on proton-i..:
Ye, Bing
;
Cai, Li
;
Luo, Jie
...
Microelectronics Reliability. 151 (2023) - p. 115280 , 2023
Link:
https://doi.org/10.1016/j.microrel.2023.115280
RT Journal T1
Exploring the impact of shrinking feature sizes on proton-induced saturation SEU cross-section through simulation
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2023.115280&Exemplar=1&LAN=DE A1 Ye, Bing A1 Cai, Li A1 Luo, Jie A1 Zhai, Pengfei A1 Juan, Yang A1 Wu, Zhaoxi A1 Gao, Shuai A1 Yan, Xiaoyu A1 Sun, Youmei A1 Liu, Jie PB Elsevier BV YR 2023 SN 0026-2714 JF Microelectronics Reliability VO 151 SP 115280 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2023.115280 DO https://doi.org/10.1016/j.microrel.2023.115280 SF ELIB - SuUB Bremen
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