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1 Ergebnisse
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Total ionizing dose and single event effect response of 22 ..:
Yin, Yanan
;
Ma, Han
;
Zheng, Qiwen
...
Microelectronics Reliability. 152 (2024) - p. 115296 , 2024
Link:
https://doi.org/10.1016/j.microrel.2023.115296
RT Journal T1
Total ionizing dose and single event effect response of 22 nm ultra-thin body and buried oxide fully depleted silicon-on-insulator technology
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2023.115296&Exemplar=1&LAN=DE A1 Yin, Yanan A1 Ma, Han A1 Zheng, Qiwen A1 Chen, Jiawei A1 Duan, Xinpei A1 Zhang, Pingwei A1 Zhou, Xinjie PB Elsevier BV YR 2024 SN 0026-2714 JF Microelectronics Reliability VO 152 SP 115296 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2023.115296 DO https://doi.org/10.1016/j.microrel.2023.115296 SF ELIB - SuUB Bremen
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