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1 Ergebnisse
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A highly reliable and low-overhead quadruple-node-upset tol..:
Xu, Hui
;
Ai, Xiaodong
;
Ma, Ruijun
...
Microelectronics Reliability. 157 (2024) - p. 115413 , 2024
Link:
https://doi.org/10.1016/j.microrel.2024.115413
RT Journal T1
A highly reliable and low-overhead quadruple-node-upset tolerant latch design
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2024.115413&Exemplar=1&LAN=DE A1 Xu, Hui A1 Ai, Xiaodong A1 Ma, Ruijun A1 Liang, Huaguo A1 Huang, Zhengfeng A1 Li, Jiuqi A1 Tang, Lin PB Elsevier BV YR 2024 SN 0026-2714 JF Microelectronics Reliability VO 157 SP 115413 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2024.115413 DO https://doi.org/10.1016/j.microrel.2024.115413 SF ELIB - SuUB Bremen
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