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1 Ergebnisse
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A low power TNU-resilient hardened latch design:
Huang, Zhengfeng
;
Ai, Lei
;
Jiang, Xinyu
...
Microelectronics Reliability. 157 (2024) - p. 115417 , 2024
Link:
https://doi.org/10.1016/j.microrel.2024.115417
RT Journal T1
A low power TNU-resilient hardened latch design
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.microrel.2024.115417&Exemplar=1&LAN=DE A1 Huang, Zhengfeng A1 Ai, Lei A1 Jiang, Xinyu A1 Gong, Zhouyu A1 Wang, Xiaolei A1 Lu, Yingchun A1 Song, Tai A1 Ouyang, Yiming A1 Yan, Aibin PB Elsevier BV YR 2024 SN 0026-2714 JF Microelectronics Reliability VO 157 SP 115417 LK http://dx.doi.org/https://doi.org/10.1016/j.microrel.2024.115417 DO https://doi.org/10.1016/j.microrel.2024.115417 SF ELIB - SuUB Bremen
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