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1 Ergebnisse
1
DNA damage levels in electronics workers in Southern China:..:
Zhao, Zhiqiang
;
Xing, Xiumei
;
Ou, Xiaoyan
...
Mutation Research/Fundamental and Molecular Mechanisms of Mutagenesis. 803-805 (2017) - p. 17-21 , 2017
Link:
https://doi.org/10.1016/j.mrfmmm.2017.07.005
RT Journal T1
DNA damage levels in electronics workers in Southern China: A micro-whole blood comet assay
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mrfmmm.2017.07.005&Exemplar=1&LAN=DE A1 Zhao, Zhiqiang A1 Xing, Xiumei A1 Ou, Xiaoyan A1 Liu, Xinxia A1 Zhou, Ridong A1 Zhang, Huimin A1 Yang, Linqing A1 Zhuang, Zhixiong A1 Su, Xiaolin A1 Lu, Yao A1 Jiang, Jun A1 Yang, Yarui A1 Cui, Dong A1 He, Yun PB Elsevier BV YR 2017 SN 0027-5107 JF Mutation Research/Fundamental and Molecular Mechanisms of Mutagenesis VO 803-805 SP 17 OP 21 LK http://dx.doi.org/https://doi.org/10.1016/j.mrfmmm.2017.07.005 DO https://doi.org/10.1016/j.mrfmmm.2017.07.005 SF ELIB - SuUB Bremen
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