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DNA damage levels in electronics workers in Southern China:..:

Zhao, Zhiqiang ; Xing, Xiumei ; Ou, Xiaoyan...
Mutation Research/Fundamental and Molecular Mechanisms of Mutagenesis.  803-805 (2017)  - p. 17-21 , 2017
Link: https://doi.org/10.1016/j.mrfmmm.2017.07.005