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Leakage current and deep levels in CoSi2 silicided junction:
Codegoni, D.
;
Carnevale, G.P.
;
De Marco, C.
..
Materials Science and Engineering: B. 124-125 (2005) - p. 349-353 , 2005
Link:
https://doi.org/10.1016/j.mseb.2005.08.125
RT Journal T1 <Title>Leakage current and deep levels in CoSi2 silicided junctions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mseb.2005.08.125&Exemplar=1&LAN=DE A1 Codegoni, D. A1 Carnevale, G.P. A1 De Marco, C. A1 Mica, I. A1 Polignano, M.L. PB Elsevier BV YR 2005 SN 0921-5107 JF Materials Science and Engineering: B VO 124-125 SP 349 OP 353 LK http://dx.doi.org/https://doi.org/10.1016/j.mseb.2005.08.125 DO https://doi.org/10.1016/j.mseb.2005.08.125 SF ELIB - SuUB Bremen
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