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Modelling of Boron Trapping at End-of-Range defects in pre-..:

Bazizi, E.M. ; Fazzini, P.F. ; Zechner, C....
Materials Science and Engineering: B.  154-155 (2008)  - p. 275-278 , 2008
Link: https://doi.org/10.1016/j.mseb.2008.09.044