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1 Ergebnisse
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Characterisation of virtual substrates with ultra-thin Si0...:
Lyutovich, Klara
;
Werner, Jens
;
Oehme, Michael
..
Materials Science in Semiconductor Processing. 8 (2005) 1-3 - p. 149-153 , 2005
Link:
https://doi.org/10.1016/j.mssp.2004.09.067
RT Journal T1 <Title>Characterisation of virtual substrates with ultra-thin Si0.6Ge0.4 strain relaxed buffers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2004.09.067&Exemplar=1&LAN=DE A1 Lyutovich, Klara A1 Werner, Jens A1 Oehme, Michael A1 Kasper, Erich A1 Perova, Tatiana PB Elsevier BV YR 2005 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 8 IS 1-3 SP 149 OP 153 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2004.09.067 DO https://doi.org/10.1016/j.mssp.2004.09.067 SF ELIB - SuUB Bremen
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