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Optical characterization of dislocation free Ge and GeOI wa..:

Kalem, Seref ; Romandic, I. ; Theuwis, A.
Materials Science in Semiconductor Processing.  9 (2006)  4-5 - p. 753-758 , 2006
Link: https://doi.org/10.1016/j.mssp.2006.08.035